Truncated Product Methods for Panel Unit Root Tests

Forthcoming in Oxford Bulletin of Economics and Statistics

18 Pages Posted: 15 Mar 2013

See all articles by Xuguang Simon Sheng

Xuguang Simon Sheng

American University - Department of Economics

Jingyun Yang

Pennsylvania State University

Date Written: February 28, 2013

Abstract

This paper proposes two new panel unit root tests based on Zaykin et al. (2002)’s truncated product method. The first one assumes constant correlation between p-values and the second one uses sieve bootstrap to allow for general forms of cross-section dependence in the panel units. Monte Carlo simulation shows that both tests have reasonably good size and are powerful in cases of some very large p-values. The proposed tests are applied to a panel of real GDP and inflation density forecasts, resulting in evidence that professional forecasters may not update their forecast precision in an optimal Bayesian way.

Keywords: Density Forecast, Panel Unit Root, P-value, Sieve Bootstrap, Truncated Product Method

JEL Classification: C12, C33

Suggested Citation

Sheng, Xuguang Simon and Yang, Jingyun, Truncated Product Methods for Panel Unit Root Tests (February 28, 2013). Forthcoming in Oxford Bulletin of Economics and Statistics, Available at SSRN: https://ssrn.com/abstract=2053149

Xuguang Simon Sheng (Contact Author)

American University - Department of Economics ( email )

4400 Massachusetts Avenue, N.W.
Washington, DC 20016-8029
United States

HOME PAGE: http://https://www.american.edu/cas/faculty/sheng.cfm

Jingyun Yang

Pennsylvania State University ( email )

204 E Calder Way, STE 400
State College, PA 16803
United States

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