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Safe Focused Ultrasound-Mediated Blood-Brain Barrier Opening and Repair is Not Mediated by Tight Junction Degradation

42 Pages Posted: 3 Jun 2020 Publication Status: Review Complete

See all articles by Tara Lynn Kugelman

Tara Lynn Kugelman

Columbia University - Department of Biomedical Engineering

Maria Eleni Karakatsani

Columbia University - Department of Biomedical Engineering

Claire Sunha Choi

Columbia University - Department of Biomedical Engineering

Yusuke Nimi

Columbia University - Department of Biomedical Engineering

Dritan Agalliu

Columbia University - Department of Neurology

Elisa E. Konofagou

Columbia University - Department of Biomedical Engineering

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Abstract

Focused ultrasound (FUS) with microbubbles opens the blood-brain barrier (BBB) to allow targeted drug delivery into the brain; however, the mechanisms of BBB opening and the response of the neurovascular unit at either low acoustic pressures, known to open the BBB transiently, or high pressures that cause brain damage, remain unclear.  Employing a transgenic mouse strain where tight junctions (TJs) are labelled with eGFP, we examined TJ strand morphology at 1 and 72 hours post-FUS at both low and high pressures.  We find that transient BBB opening due to FUS is not caused by TJ strand damage, unless FUS is used at high pressures, and this is localized primarily in arterioles and capillaries. At high pressures, TJ strands are obliterated and remain unrepaired even at 72 hours, allowing for fibrinogen passage, and persistent microglial activation. Our findings suggest that at low safe pressures, upregulation of transcytosis may likely increase transiently BBB permeability to deliver therapeutics to the brain.

Keywords: blood-brain barrier, focused ultrasound, tight junctions, neurovascular unit, reactive microglia, reactive astrocyte

Suggested Citation

Kugelman, Tara Lynn and Karakatsani, Maria Eleni and Choi, Claire Sunha and Nimi, Yusuke and Agalliu, Dritan and Konofagou, Elisa E., Safe Focused Ultrasound-Mediated Blood-Brain Barrier Opening and Repair is Not Mediated by Tight Junction Degradation. Available at SSRN: https://ssrn.com/abstract=3599080 or http://dx.doi.org/10.2139/ssrn.3599080
This version of the paper has not been formally peer reviewed.

Tara Lynn Kugelman

Columbia University - Department of Biomedical Engineering

3022 Broadway
New York, NY 10027
United States

Maria Eleni Karakatsani

Columbia University - Department of Biomedical Engineering

3022 Broadway
New York, NY 10027
United States

Claire Sunha Choi

Columbia University - Department of Biomedical Engineering

3022 Broadway
New York, NY 10027
United States

Yusuke Nimi

Columbia University - Department of Biomedical Engineering

3022 Broadway
New York, NY 10027
United States

Dritan Agalliu

Columbia University - Department of Neurology ( email )

New York, NY
United States

Elisa E. Konofagou (Contact Author)

Columbia University - Department of Biomedical Engineering ( email )

United States

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