Stressed Distance to Default and Default Risk

20 Pages Posted: 1 Sep 2022

See all articles by Nan Guo

Nan Guo

China Bond Rating Co. Ltd.

Lingfei Li

The Chinese University of Hong Kong

Multiple version iconThere are 2 versions of this paper

Date Written: August 31, 2022

Abstract

Distance to default (DTD) is a strong predictor of default risk. In this paper we propose a stressed version of DTD (the 'stressed DTD') to measure time-varying corporate default risk in the event that a systematic stress scenario occurs. We show that the stressed DTD is a better predictor of corporate defaults during the 2007–9 global financial crisis compared with the regular DTD, the Campbell–Hilscher–Szilagyi probability of default measure and the systematic default risk measure ('failure beta'). By controlling for raw default probability and failure beta, we show that the stressed DTD can explain variations in both credit default swap spreads and credit ratings. Our results provide both evidence that investors require compensation for exposure to stressed default risk and a rationale for considering credit stability under stress in ratings.

Keywords: default risk, distance to default (DTD), stress testing, credit default swap (CDS), credit rating

Suggested Citation

Guo, Nan and Li, Lingfei, Stressed Distance to Default and Default Risk (August 31, 2022). Journal of Credit Risk, Vol. 18, No. 3, 2022, Available at SSRN: https://ssrn.com/abstract=4205519

Nan Guo (Contact Author)

China Bond Rating Co. Ltd. ( email )

Lingfei Li

The Chinese University of Hong Kong ( email )

Shatin, New Territories
Hong Kong

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